Skip to main navigation Skip to search Skip to main content

Tof-sims investigation of epoxy resin curing reaction at different resin to hardener ratios

  • Firas Awaja
  • , Grant Van Riessen
  • , Georgina Kelly
  • , Bronwyn Fox
  • , Paul J. Pigram
  • Deakin University
  • La Trobe University

Research output: Contribution to a Journal (Peer & Non Peer)Articlepeer-review

12 Citations (Scopus)

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal components analysis (PCA) were used to analyze diglycidyl ether of bisphenol A (DGEBA) and diglycidyl ether of bisphenol F (DGEBF) epoxy resin blend cured with isophorone diamine (IPD) hardener at different resin to hardener ratios. The aim was to establish correlations between the hardener concentration and the nature and progress of the crosslinking reaction. Insights into the cured resin structure revealed using ToF-SIMS are discussed. Three sets of significant secondary ions have been identified by PCA. Secondary ions such as C 14H7O+, CHO+, CH3O +, and C21H24O4+ showed variance related to the completion of the curing reaction. Relative intensities of CxHyNz+ ions in the cured resin samples are indicative of the un-reacted and partially reacted hardener molecules, and are found to be proportional to the resin to hardener mixing ratio. The relative ion intensities of the aliphatic hydrocarbon ions are shown to relate to the cured resin crosslinking density.

Original languageEnglish
Pages (from-to)2711-2717
Number of pages7
JournalJournal of Applied Polymer Science
Volume110
Issue number5
DOIs
Publication statusPublished - 5 Dec 2008
Externally publishedYes

Keywords

  • Crosslinking
  • Epoxy resin
  • PCA
  • Secondary ions
  • ToF-SIMS

Fingerprint

Dive into the research topics of 'Tof-sims investigation of epoxy resin curing reaction at different resin to hardener ratios'. Together they form a unique fingerprint.

Cite this