Three-dimensional depth-resolved and extended-resolution micro-particle characterization by holographic light scattering spectroscopy

Thomas Gutzler, Timothy R. Hillman, Sergey A. Alexandrov, David D. Sampson

Research output: Contribution to a Journal (Peer & Non Peer)Articlepeer-review

7 Citations (Scopus)

Abstract

Fourier-holographic light scattering spectroscopy is applied to record complex angular scattering spectra of two- and three-dimensional samples over a wide field of view. We introduce a computational depth sectioning technique and, for the first time, demonstrate that a single-exposure hologram can generate a quantitative, three-dimensional map of particle sizes and locations over several cubic millimeters with micrometer resolution. Such spatially resolved maps of particle sizes are generated by Mie-inversion and could not be ascertained from the directly reconstructed intensity-distribution images. We also demonstrate synthesis of multiple angular scattering intensity spectra to increase the angular range and improve size detection sensitivity.

Original languageEnglish
Pages (from-to)25116-25126
Number of pages11
JournalOptics Express
Volume18
Issue number24
DOIs
Publication statusPublished - 22 Nov 2010
Externally publishedYes

Fingerprint

Dive into the research topics of 'Three-dimensional depth-resolved and extended-resolution micro-particle characterization by holographic light scattering spectroscopy'. Together they form a unique fingerprint.

Cite this