Spectral contrast imaging microscopy

Sergey A. Alexandrov, Shikhar Uttam, Rajan K. Bista, Yang Liu

Research output: Contribution to a Journal (Peer & Non Peer)Articlepeer-review

18 Citations (Scopus)

Abstract

We introduce a new technique, spectral contrast imaging microscopy (SCIM), for super-resolution microscopic imaging. Based on a novel contrast mechanism that encodes each local spatial frequency with a corresponding optical wavelength, SCIM provides a real-time high-resolution spectral contrast microscopic image with superior contrast. We show that two microscopic objects, separated by a distance smaller than the diffraction limit of the optical system, can be spatially resolved in the SCIM image as different colors. Results with numerical simulation and experiments using a high-resolution United States Air Force target are presented. The ability of SCIM for imaging biological cells is also demonstrated.

Original languageEnglish
Pages (from-to)3323-3325
Number of pages3
JournalOptics Letters
Volume36
Issue number17
DOIs
Publication statusPublished - 1 Sep 2011
Externally publishedYes

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