Proposal of a Universal Test Scene for Depth Map Evaluation

Peter Corcoran

Proposal of a Universal Test Scene for Depth Map Evaluation

Peter Corcoran

Electrical & Electronic Engineering

Research output: Chapter in Book or Conference Publication/Proceeding › Conference Publication › peer-review

Abstract

Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.

Original language	English (Ireland)
Title of host publication	2013 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE)
Publisher	IEEE
Publication status	Published - 1 Jan 2013

Authors (Note for portal: view the doc link for the full list of authors)

Authors
Andorko, I;Corcoran, P;Bigioi, P

Cite this

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title = "Proposal of a Universal Test Scene for Depth Map Evaluation",

abstract = "Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.",

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N2 - Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.

AB - Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.

M3 - Conference Publication

BT - 2013 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE)

PB - IEEE

ER -

Proposal of a Universal Test Scene for Depth Map Evaluation

Abstract

Authors (Note for portal: view the doc link for the full list of authors)

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Cite this