TY - GEN
T1 - Proposal of a universal test scene for depth map evaluation
AU - Andorko, Istvan
AU - Corcoran, Peter
AU - Bigioi, Petronel
PY - 2013
Y1 - 2013
N2 - Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.
AB - Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.
UR - https://www.scopus.com/pages/publications/84876395337
U2 - 10.1109/ICCE.2013.6486836
DO - 10.1109/ICCE.2013.6486836
M3 - Conference Publication
AN - SCOPUS:84876395337
SN - 9781467313612
T3 - Digest of Technical Papers - IEEE International Conference on Consumer Electronics
SP - 151
EP - 152
BT - 2013 IEEE International Conference on Consumer Electronics, ICCE 2013
T2 - 2013 IEEE International Conference on Consumer Electronics, ICCE 2013
Y2 - 11 January 2013 through 14 January 2013
ER -