Proposal of a Universal Test Scene for Depth Map Evaluation

Research in the area of depth map generation has been an active topic for the past few decades, but it is only recently, that depth map generation algorithms have found their way into consumer electronic devices. The issue is, that there is a lack in depth map testing environments for consumer devices which are using additional devices such as Time-of-Flight (ToF) or Infra-Red (IR cameras). For this reason, this paper introduces a new depth map testing scene suitable for consumer electronic devices, which can be reproduced by only following the instructions.(1)