MICROELECTRONIC ENGINEERING

Research output: Chapter in Book or Conference Publication/ProceedingConference Publicationpeer-review

Abstract

The integrated photoluminescence (PL) intensities of capped InP GaInP quantum dot structures have been measured as a function of temperature, The PL is found to decrease by up to four orders of magnitude as the temperature is raised from 18 to 300 K. The temperature data show an Arrhenius behaviour characterised by three activation energies. Analysis of this dependence indicates that the major loss mechanism is thermal activation of excitons out of the dots, followed by nonradiative recombination in the barriers. Identical samples were grown without a capping layer in order to study the morphology of the dots using an atomic force microscope (AFM). (C) 2000 Elsevier Science B.V. All rights reserved.
Original languageEnglish (Ireland)
Title of host publicationTemperature dependence of InP GaInP quantum dot photoluminescence
Number of pages6
Volume51-2
Publication statusPublished - 1 May 2000

Authors (Note for portal: view the doc link for the full list of authors)

  • Authors
  • Beirne, GJ,Farrell, IL,Grogan, CM,Connolly, JO,O'Connor, GM,Glynn, TJ,Thomas, KK,Lambkin, JD

Fingerprint

Dive into the research topics of 'MICROELECTRONIC ENGINEERING'. Together they form a unique fingerprint.

Cite this