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Label free ultra-sensitive imaging with sub-diffraction spatial resolution

  • Sergey Alexandrov
  • , Nandan Das
  • , J. G. McGrath
  • , Peter Owens
  • , Colin J. R. Sheppard
  • , Francesca Boccafoschi
  • , Cinzia Giannini
  • , Teresa Sibillano
  • , Hrebesh Subhash
  • , Martin Leahy
  • University of Galway
  • Istituto Italiano di Tecnologia
  • Dipartimento di Scienze della Salute
  • Consiglio Nazionale delle Ricerche
  • Colgate-Palmolive Global Technology Center

Research output: Chapter in Book or Conference Publication/ProceedingConference Publicationpeer-review

Abstract

In this paper, we show a new way to break the resolution limit and dramatically improve sensitivity to structural changes. To realize it we developed a novel label free contrast mechanism, based on the spectral encoding of spatial frequency (SESF) approach. The super-resolution SESF (srSESF) microscopy is based on reconstruction of the axial spatial frequency (period) profiles for each image point and comparison of these profiles to form super-resolution image. As a result, the information content of images is dramatically improved in comparison with conventional microscopy. Numerical simulation and experiments demonstrate significant improvement in sensitivity and resolution.

Original languageEnglish
Title of host publication21st International Conference on Transparent Optical Networks, ICTON 2019
PublisherIEEE Computer Society
ISBN (Electronic)9781728127798
DOIs
Publication statusPublished - Jul 2019
Event21st International Conference on Transparent Optical Networks, ICTON 2019 - Angers, France
Duration: 9 Jul 201913 Jul 2019

Publication series

NameInternational Conference on Transparent Optical Networks
Volume2019-July
ISSN (Electronic)2162-7339

Conference

Conference21st International Conference on Transparent Optical Networks, ICTON 2019
Country/TerritoryFrance
CityAngers
Period9/07/1913/07/19

Keywords

  • Label free imaging
  • Nano-sensitivity
  • Optical microscopy
  • Spatial frequency
  • Super-resolution

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