Label free ultra-sensitive imaging with sub-diffraction spatial resolution

Sergey Alexandrov; Nandan Das; James McGrath; Peter Owens; Colin J.R. Sheppard; Francesca Boccafoschi; Cinzia Giannini; Teresa Sibillano; Hrebesh Subhash; Martin Leahy

doi:10.1109/ICTON.2019.8840220

Label free ultra-sensitive imaging with sub-diffraction spatial resolution

Sergey Alexandrov, Nandan Das, James McGrath, Peter Owens, Colin J.R. Sheppard, Francesca Boccafoschi, Cinzia Giannini, Teresa Sibillano, Hrebesh Subhash, Martin Leahy

Research output: Chapter in Book or Conference Publication/Proceeding › Conference Publication › peer-review

Abstract

In this paper, we show a new way to break the resolution limit and dramatically improve sensitivity to structural changes. To realize it we developed a novel label free contrast mechanism, based on the spectral encoding of spatial frequency (SESF) approach. The super-resolution SESF (srSESF) microscopy is based on reconstruction of the axial spatial frequency (period) profiles for each image point and comparison of these profiles to form super-resolution image. As a result, the information content of images is dramatically improved in comparison with conventional microscopy. Numerical simulation and experiments demonstrate significant improvement in sensitivity and resolution.

Original language	English
Title of host publication	21st International Conference on Transparent Optical Networks, ICTON 2019
Publisher	IEEE Computer Society
ISBN (Electronic)	9781728127798
DOIs	https://doi.org/10.1109/ICTON.2019.8840220
Publication status	Published - Jul 2019
Event	21st International Conference on Transparent Optical Networks, ICTON 2019 - Angers, France Duration: 9 Jul 2019 → 13 Jul 2019

Publication series

Name	International Conference on Transparent Optical Networks
Volume	2019-July
ISSN (Electronic)	2162-7339

Conference

Conference	21st International Conference on Transparent Optical Networks, ICTON 2019
Country/Territory	France
City	Angers
Period	9/07/19 → 13/07/19

Keywords

Label free imaging
Nano-sensitivity
Optical microscopy
Spatial frequency
Super-resolution

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10.1109/ICTON.2019.8840220

Cite this

Alexandrov, S., Das, N., McGrath, J., Owens, P., Sheppard, C. J. R., Boccafoschi, F., Giannini, C., Sibillano, T., Subhash, H., & Leahy, M. (2019). Label free ultra-sensitive imaging with sub-diffraction spatial resolution. In 21st International Conference on Transparent Optical Networks, ICTON 2019 Article 8840220 (International Conference on Transparent Optical Networks; Vol. 2019-July). IEEE Computer Society. https://doi.org/10.1109/ICTON.2019.8840220

@inproceedings{ae82ed39caf44171bc36a97de0a1bc11,

title = "Label free ultra-sensitive imaging with sub-diffraction spatial resolution",

abstract = "In this paper, we show a new way to break the resolution limit and dramatically improve sensitivity to structural changes. To realize it we developed a novel label free contrast mechanism, based on the spectral encoding of spatial frequency (SESF) approach. The super-resolution SESF (srSESF) microscopy is based on reconstruction of the axial spatial frequency (period) profiles for each image point and comparison of these profiles to form super-resolution image. As a result, the information content of images is dramatically improved in comparison with conventional microscopy. Numerical simulation and experiments demonstrate significant improvement in sensitivity and resolution.",

keywords = "Label free imaging, Nano-sensitivity, Optical microscopy, Spatial frequency, Super-resolution",

author = "Sergey Alexandrov and Nandan Das and James McGrath and Peter Owens and Sheppard, \{Colin J.R.\} and Francesca Boccafoschi and Cinzia Giannini and Teresa Sibillano and Hrebesh Subhash and Martin Leahy",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 21st International Conference on Transparent Optical Networks, ICTON 2019 ; Conference date: 09-07-2019 Through 13-07-2019",

year = "2019",

month = jul,

doi = "10.1109/ICTON.2019.8840220",

language = "English",

series = "International Conference on Transparent Optical Networks",

publisher = "IEEE Computer Society",

booktitle = "21st International Conference on Transparent Optical Networks, ICTON 2019",

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Alexandrov, S, Das, N, McGrath, J, Owens, P, Sheppard, CJR, Boccafoschi, F, Giannini, C, Sibillano, T, Subhash, H & Leahy, M 2019, Label free ultra-sensitive imaging with sub-diffraction spatial resolution. in 21st International Conference on Transparent Optical Networks, ICTON 2019., 8840220, International Conference on Transparent Optical Networks, vol. 2019-July, IEEE Computer Society, 21st International Conference on Transparent Optical Networks, ICTON 2019, Angers, France, 9/07/19. https://doi.org/10.1109/ICTON.2019.8840220

Label free ultra-sensitive imaging with sub-diffraction spatial resolution. / Alexandrov, Sergey; Das, Nandan; McGrath, James et al.
21st International Conference on Transparent Optical Networks, ICTON 2019. IEEE Computer Society, 2019. 8840220 (International Conference on Transparent Optical Networks; Vol. 2019-July).

Research output: Chapter in Book or Conference Publication/Proceeding › Conference Publication › peer-review

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T1 - Label free ultra-sensitive imaging with sub-diffraction spatial resolution

AU - Alexandrov, Sergey

AU - Das, Nandan

AU - McGrath, James

AU - Owens, Peter

AU - Sheppard, Colin J.R.

AU - Boccafoschi, Francesca

AU - Giannini, Cinzia

AU - Sibillano, Teresa

AU - Subhash, Hrebesh

AU - Leahy, Martin

PY - 2019/7

Y1 - 2019/7

N2 - In this paper, we show a new way to break the resolution limit and dramatically improve sensitivity to structural changes. To realize it we developed a novel label free contrast mechanism, based on the spectral encoding of spatial frequency (SESF) approach. The super-resolution SESF (srSESF) microscopy is based on reconstruction of the axial spatial frequency (period) profiles for each image point and comparison of these profiles to form super-resolution image. As a result, the information content of images is dramatically improved in comparison with conventional microscopy. Numerical simulation and experiments demonstrate significant improvement in sensitivity and resolution.

AB - In this paper, we show a new way to break the resolution limit and dramatically improve sensitivity to structural changes. To realize it we developed a novel label free contrast mechanism, based on the spectral encoding of spatial frequency (SESF) approach. The super-resolution SESF (srSESF) microscopy is based on reconstruction of the axial spatial frequency (period) profiles for each image point and comparison of these profiles to form super-resolution image. As a result, the information content of images is dramatically improved in comparison with conventional microscopy. Numerical simulation and experiments demonstrate significant improvement in sensitivity and resolution.

KW - Label free imaging

KW - Nano-sensitivity

KW - Optical microscopy

KW - Spatial frequency

KW - Super-resolution

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M3 - Conference Publication

AN - SCOPUS:85073060959

T3 - International Conference on Transparent Optical Networks

BT - 21st International Conference on Transparent Optical Networks, ICTON 2019

PB - IEEE Computer Society

T2 - 21st International Conference on Transparent Optical Networks, ICTON 2019

Y2 - 9 July 2019 through 13 July 2019

ER -

Label free ultra-sensitive imaging with sub-diffraction spatial resolution

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