Inverse problem approach to the detection of exoplanets in multi-wavelength data

N. Devaney, E. Thiébaut

Research output: Chapter in Book or Conference Publication/ProceedingConference Publicationpeer-review

Abstract

Images obtained at different wavelengths may be used to discriminate faint exoplanets from residual speckle in the stellar PSF. We have developed an inverse problem approach to fit multi-wavelength data which shows improved detection limits.

Original languageEnglish
Title of host publicationApplied Industrial Optics
Subtitle of host publicationSpectroscopy, Imaging and Metrology, AIO 2011
Publication statusPublished - 2011
EventApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2011 - Toronto, Canada
Duration: 10 Jul 201114 Jul 2011

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2011
Country/TerritoryCanada
CityToronto
Period10/07/1114/07/11

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