Interference refractometer and thickness meter

Serguei A. Alexandrov; Igor V. Chernyh; Valery N. Korban

doi:10.1117/12.250811

Interference refractometer and thickness meter

Serguei A. Alexandrov, Igor V. Chernyh, Valery N. Korban

Research output: Contribution to a Journal (Peer & Non Peer) › Conference article › peer-review

Abstract

The experimental model of laser interference refractometer and thicknessmeter (IRT) for simultaneous measurement of absolute refractive index and thickness of the plane parallel samples has been developed, manufactured and investigated. This IRT allows to test solid, liquid and gaseous media, including optical crystals, plastics and other sheet materials, over a wide spectral range. IRT accuracy of refractive index measurement is not worse than from the best modern goniometers and accuracy of thickness measurement corresponds to the interference accuracy.

Original language	English
Pages (from-to)	778-785
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2782
DOIs	https://doi.org/10.1117/12.250811
Publication status	Published - 2004
Externally published	Yes
Event	Optical Inspection and Micromeasurements - Besancon, France Duration: 10 Jun 1996 → 10 Jun 1996

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10.1117/12.250811

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title = "Interference refractometer and thickness meter",

abstract = "The experimental model of laser interference refractometer and thicknessmeter (IRT) for simultaneous measurement of absolute refractive index and thickness of the plane parallel samples has been developed, manufactured and investigated. This IRT allows to test solid, liquid and gaseous media, including optical crystals, plastics and other sheet materials, over a wide spectral range. IRT accuracy of refractive index measurement is not worse than from the best modern goniometers and accuracy of thickness measurement corresponds to the interference accuracy.",

author = "Alexandrov, \{Serguei A.\} and Chernyh, \{Igor V.\} and Korban, \{Valery N.\}",

year = "2004",

doi = "10.1117/12.250811",

language = "English",

volume = "2782",

pages = "778--785",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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publisher = "SPIE",

note = "Optical Inspection and Micromeasurements ; Conference date: 10-06-1996 Through 10-06-1996",

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TY - JOUR

T1 - Interference refractometer and thickness meter

AU - Alexandrov, Serguei A.

AU - Chernyh, Igor V.

AU - Korban, Valery N.

PY - 2004

Y1 - 2004

N2 - The experimental model of laser interference refractometer and thicknessmeter (IRT) for simultaneous measurement of absolute refractive index and thickness of the plane parallel samples has been developed, manufactured and investigated. This IRT allows to test solid, liquid and gaseous media, including optical crystals, plastics and other sheet materials, over a wide spectral range. IRT accuracy of refractive index measurement is not worse than from the best modern goniometers and accuracy of thickness measurement corresponds to the interference accuracy.

AB - The experimental model of laser interference refractometer and thicknessmeter (IRT) for simultaneous measurement of absolute refractive index and thickness of the plane parallel samples has been developed, manufactured and investigated. This IRT allows to test solid, liquid and gaseous media, including optical crystals, plastics and other sheet materials, over a wide spectral range. IRT accuracy of refractive index measurement is not worse than from the best modern goniometers and accuracy of thickness measurement corresponds to the interference accuracy.

UR - https://www.scopus.com/pages/publications/78951496037

U2 - 10.1117/12.250811

DO - 10.1117/12.250811

M3 - Conference article

AN - SCOPUS:78951496037

SN - 0277-786X

VL - 2782

SP - 778

EP - 785

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Optical Inspection and Micromeasurements

Y2 - 10 June 1996 through 10 June 1996

ER -

Interference refractometer and thickness meter

Abstract

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