Interference method for determination of the refractive index and thickness

Serguei A. Alexandrov; Igor V. Chernyh

doi:10.13025/15700

Interference method for determination of the refractive index and thickness

Serguei A. Alexandrov
, Igor V. Chernyh

RBP Optoelectronics
JSC Peleng

Research output: Contribution to a Journal (Peer & Non Peer) › Article › peer-review

23 Citations (Scopus)

Abstract

The interference method for simultaneous measurement of the absolute refractive index and the thickness of plane parallel samples is developed. This method enables us to test solid (including optical glasses, crystals, plastics, and other sheet materials), liquid, and gaseous media over a wide spectral range. The experimental model for the realization of this method, the laser interference refractometer and thicknessmeter (IRT), is manufactured and investigated. The IRT accuracy of the refractive index measurement is not worse than that of the best modern goniometers and the accuracy of the thickness measurement corresponds to the interference accuracy.

Original language	English
Pages (from-to)	2480-2486
Number of pages	7
Journal	Optical Engineering
Volume	39
Issue number	9
DOIs	https://doi.org/10.13025/15700 https://doi.org/10.1117/1.1287583
Publication status	Published - Sept 2000
Externally published	Yes

Access to Document

10.13025/15700Licence: CC BY-NC-ND
10.1117/1.1287583

Opt Eng 2000 AlexandrovAccepted author manuscript, 4.22 MBLicence: CC BY-NC-ND

Cite this

@article{5519aaad96524c369894aae4fe15265c,

title = "Interference method for determination of the refractive index and thickness",

abstract = "The interference method for simultaneous measurement of the absolute refractive index and the thickness of plane parallel samples is developed. This method enables us to test solid (including optical glasses, crystals, plastics, and other sheet materials), liquid, and gaseous media over a wide spectral range. The experimental model for the realization of this method, the laser interference refractometer and thicknessmeter (IRT), is manufactured and investigated. The IRT accuracy of the refractive index measurement is not worse than that of the best modern goniometers and the accuracy of the thickness measurement corresponds to the interference accuracy.",

author = "Alexandrov, \{Serguei A.\} and Chernyh, \{Igor V.\}",

year = "2000",

month = sep,

doi = "10.13025/15700",

language = "English",

volume = "39",

pages = "2480--2486",

journal = "Optical Engineering",

issn = "0091-3286",

publisher = "SPIE",

number = "9",

}

TY - JOUR

T1 - Interference method for determination of the refractive index and thickness

AU - Alexandrov, Serguei A.

AU - Chernyh, Igor V.

PY - 2000/9

Y1 - 2000/9

N2 - The interference method for simultaneous measurement of the absolute refractive index and the thickness of plane parallel samples is developed. This method enables us to test solid (including optical glasses, crystals, plastics, and other sheet materials), liquid, and gaseous media over a wide spectral range. The experimental model for the realization of this method, the laser interference refractometer and thicknessmeter (IRT), is manufactured and investigated. The IRT accuracy of the refractive index measurement is not worse than that of the best modern goniometers and the accuracy of the thickness measurement corresponds to the interference accuracy.

AB - The interference method for simultaneous measurement of the absolute refractive index and the thickness of plane parallel samples is developed. This method enables us to test solid (including optical glasses, crystals, plastics, and other sheet materials), liquid, and gaseous media over a wide spectral range. The experimental model for the realization of this method, the laser interference refractometer and thicknessmeter (IRT), is manufactured and investigated. The IRT accuracy of the refractive index measurement is not worse than that of the best modern goniometers and the accuracy of the thickness measurement corresponds to the interference accuracy.

UR - http://hdl.handle.net/10379/17143

UR - https://www.scopus.com/pages/publications/0034266509

U2 - 10.13025/15700

DO - 10.13025/15700

M3 - Article

SN - 0091-3286

VL - 39

SP - 2480

EP - 2486

JO - Optical Engineering

JF - Optical Engineering

IS - 9

ER -

Interference method for determination of the refractive index and thickness

Abstract

Access to Document

Other files and links

Fingerprint

Cite this