Improving Product Quality Control in Smart Manufacturing through Transfer Learning-Based Fault Detection

Research output: Chapter in Book or Conference Publication/Proceeding › Conference Publication › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	The 9th IEEE International Conference on Smart Computing (SMARTCOMP 2023)
Publisher	IEEE
DOIs	https://doi.org/10.1109/SMARTCOMP58114.2023.00051
Publication status	Published - 26 Jun 2023

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

@inproceedings{f943bd8ac96c4035947b7c948f530488,

title = "Improving Product Quality Control in Smart Manufacturing through Transfer Learning-Based Fault Detection",

author = "Nitesh Bharot and Mirco Soderi and Priyanka Verma and Breslin, \{John G\}",

year = "2023",

month = jun,

day = "26",

doi = "10.1109/SMARTCOMP58114.2023.00051",

language = "Undefined/Unknown",

booktitle = "The 9th IEEE International Conference on Smart Computing (SMARTCOMP 2023)",

publisher = "IEEE",

}

TY - GEN

T1 - Improving Product Quality Control in Smart Manufacturing through Transfer Learning-Based Fault Detection

AU - Bharot, Nitesh

AU - Soderi, Mirco

AU - Verma, Priyanka

AU - Breslin, John G

PY - 2023/6/26

Y1 - 2023/6/26

U2 - 10.1109/SMARTCOMP58114.2023.00051

DO - 10.1109/SMARTCOMP58114.2023.00051

M3 - Conference Publication

BT - The 9th IEEE International Conference on Smart Computing (SMARTCOMP 2023)

PB - IEEE

ER -