Far-field method for the characterization of threedimensional fields

  • Oscar Rodríguez
  • , David Lara
  • , Chris Dainty

Research output: Chapter in Book or Conference Publication/ProceedingConference Publicationpeer-review

Abstract

We introduce a polarimetry-based far-field method for the study of the interaction between a three-dimensional focused field and a sub-resolution scatterer in the focal region of a high numerical aperture lens. We show that it is possible to analyze this interaction by measuring the spatially-resolved polarization state of the scattered light across the exit pupil of the detection system. This method may be used to analyze objects with sub-resolution features.

Original languageEnglish
Title of host publicationFrontiers in Optics, FiO 2008
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528612
DOIs
Publication statusPublished - 2008
EventFrontiers in Optics, FiO 2008 - Rochester, NY, United States
Duration: 19 Oct 200823 Oct 2008

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceFrontiers in Optics, FiO 2008
Country/TerritoryUnited States
CityRochester, NY
Period19/10/0823/10/08

Fingerprint

Dive into the research topics of 'Far-field method for the characterization of threedimensional fields'. Together they form a unique fingerprint.

Cite this