| Original language | English (Ireland) |
|---|---|
| Media of output | Conference Paper |
| Place of Publication | Delft |
| Publication status | Published - 1 Oct 2003 |
Depth-resolved polarization sensitive imaging using a confocal complete Mueller matrix ellipsometer. EOS Topical Meeting on Advanced Imaging Techniques
Chris Dainty
Research output: Other contribution (Published) › Other contribution