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Characterisation of semiconductor materials using Raman scattering.

  • Thomas J. Glynn

Research output: Contribution to a Journal (Peer & Non Peer) › Article

Original languageEnglish (Ireland)
JournalKey Engineering Materials 72/74
Publication statusPublished - 1 Jan 1992

Authors (Note for portal: view the doc link for the full list of authors)

  • Authors
  • Glynn, T.J.,O'Connor, G.M.,Morgan,G.P.

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