Abstract
This paper examines the problem of performing automatic real-time detection of flash eye defects (redeye) in the firmware of a digital camera. Several different algorithms are compared, timing and memory requirements on several embedded architectures are presented. A discussion on advanced in-camera techniques to improve on standard algorithms is also presented.
| Original language | English |
|---|---|
| Article number | 3.3-4 |
| Pages (from-to) | 129-130 |
| Number of pages | 2 |
| Journal | Digest of Technical Papers - IEEE International Conference on Consumer Electronics |
| DOIs | |
| Publication status | Published - 2005 |
| Externally published | Yes |
| Event | 2005 Digest of Technical Papers - International Conference on Consumer Electronics, ICCE 2005 - Las Vegas, NV, United States Duration: 8 Jan 2005 → 12 Jan 2005 |