Application of Spectral Reflectivity to the Measurement of Thin-Film Thickness

Research output: Chapter in Book or Conference Publication/Proceeding › Conference Publication › peer-review

Original languageEnglish (Ireland)
Title of host publicationOptics Photonics Technologies and Applications, SPIE Proceedings
Volume4876
Publication statusPublished - 1 Jan 2003

Authors (Note for portal: view the doc link for the full list of authors)

  • Authors
  • Oconnor,G.M.

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