Skip to main navigation Skip to search Skip to main content

Analysis of a kick-out diffusion mechanism with charge effects

  • Univ Coll

Research output: Contribution to a Journal (Peer & Non Peer)Articlepeer-review

Abstract

In this paper we analyse a kick-out model for impurity diffusion in compound semiconductors. The form for the model described here has not previously appeared in the literature. The substitutional impurities are fixed to be singly negatively charged while the self-interstitials are taken to be neutral. The charge on the interstitial impurity atoms can take any integer value. Both one- and two-dimensional in-diffusion problems are studied. It is found that the impurity diffusion is quite sensitive to the charge on the impurity interstitials.

Original languageEnglish
Pages (from-to)515-541
Number of pages27
JournalQuarterly Journal of Mechanics and Applied Mathematics
Volume51
Issue numberpt 4
DOIs
Publication statusPublished - 1998
Externally publishedYes

Fingerprint

Dive into the research topics of 'Analysis of a kick-out diffusion mechanism with charge effects'. Together they form a unique fingerprint.

Cite this