An analytic-numerical image flicker study to test novel flicker metrics

Brian Deegan

Electrical & Electronic Engineering

Research output: Contribution to a Journal (Peer & Non Peer) › Article › peer-review

Original language	English (Ireland)
Number of pages	7
Journal	Electronic Imaging
Volume	33
Publication status	Published - 1 Jan 2021

Authors (Note for portal: view the doc link for the full list of authors)

Authors
Christian Wittpahl and Brian Deegan and Bob Black and Alexander Braun

Cite this