2013 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE)

Peter Corcoran

2013 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE)

Peter Corcoran

Electrical & Electronic Engineering

Research output: Chapter in Book or Conference Publication/Proceeding › Conference Publication › peer-review

Abstract

Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.

Original language	English (Ireland)
Title of host publication	Proposal of a Universal Test Scene for Depth Map Evaluation
Number of pages	2
Publication status	Published - 1 Jan 2013

Authors (Note for portal: view the doc link for the full list of authors)

Authors
Andorko, I,Corcoran, P,Bigioi, P,

Cite this

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title = "2013 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE)",

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M3 - Conference Publication

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2013 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS (ICCE)

Abstract

Authors (Note for portal: view the doc link for the full list of authors)

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Cite this